Login

Vi har for tiden tekniske problemer. Ditt skjema har ikke blitt innsendt. Vi beklager så mye og håper du vil prøve igjen senere. Detaljer:

Download

Register

Vi har for tiden tekniske problemer. Ditt skjema har ikke blitt innsendt. Vi beklager så mye og håper du vil prøve igjen senere. Detaljer:

Download

Thank you for registering

An email to complete your account has been sent to

Return to the website

get direct access

Fill in your details below and get direct access to content on this page

Text error notification

Text error notification

Checkbox error notification

Checkbox error notification

Vi har for tiden tekniske problemer. Ditt skjema har ikke blitt innsendt. Vi beklager så mye og håper du vil prøve igjen senere. Detaljer:

Download

Thank you for your interest

You now have access to Tracking FOUPs in the semiconductor manufacturing process

A confirmation email has been sent to

Continue to page

Please or get direct access to download this document

Tracking FOUPs in semiconductor manufacturing is important for contamination control, process optimization, yield improvement, quality control and compliance. It ensures the protection of wafers, optimizes workflow, enhances yield and maintains quality.

Application: FOUP traceability

Efficiently tracking FOUPs in semiconductor manufacturing can be challenging due to the complexity of managing numerous FOUPs, handling large amounts of data, integrating with existing systems, ensuring automation accuracy, dealing with environmental factors, and complying with industry standards.

Our solution: RFID for full process traceability

OMRON's RFID technology offers specialized features for semiconductor applications, including chemical resistance, compatibility with standardized glass transponders from Texas Instruments (reading and writing), and support for SECS I/II protocol.

This advanced solution supports five SEMI standards and SECS/GEM, ensuring consistent handling of FOUPs and pods in semiconductor fabs. Tailored for SEMI, this technology enhances wafer protection, optimizes workflow, and boosts yield and quality.

Enabling Technologies

V640 SEMI

Semiconductor applications require special product features in terms of chemical resistance and protocol for identification systems. OMRON's V640 is able to provide both e.g. communication with standardized glass transponders from Texas Instruments and SECS I/II protocol as well.

Related Products

Do you want to know more?

Contact Our Experts

+47 22 65 75 00
Contact us

Kontakt meg Wafer FOUP Traceability

digital semiconductors applications wafer foup traceability fcard sol

Vennligst fyll inn alle obligatoriske felter. Dine personlige opplysninger vil bli behandlet konfidensielt.

Text error notification

Text error notification

Text error notification

Text error notification

Country error notification

Text area error notification

Checkbox error notification

Checkbox error notification

Takk for din forespørsel. Vi vil kontakte deg så snart som mulig.

Vi har for tiden tekniske problemer. Ditt skjema har ikke blitt innsendt. Vi beklager så mye og håper du vil prøve igjen senere. Detaljer:

Download
+47 22 65 75 00
+47 22 65 75 00